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array(62) { ["id"]=> string(3) "344" ["icon_url"]=> string(79) "http://172.17.42.1/lims/cache/1c901b57c749768cc4fc6569584830ac.png?_=1679428804" ["icon16_url"]=> string(79) "http://172.17.42.1/lims/cache/dd0255cb9e64e3e663dcb190523d54eb.png?_=1679428804" ["icon32_url"]=> string(79) "http://172.17.42.1/lims/cache/1c901b57c749768cc4fc6569584830ac.png?_=1679428804" ["icon48_url"]=> string(79) "http://172.17.42.1/lims/cache/4183cfa41c250cfad6ea0792108f3922.png?_=1679428804" ["icon64_url"]=> string(79) "http://172.17.42.1/lims/cache/292f1774ec587bc83eea9ebd1e62dc75.png?_=1679428804" ["icon128_url"]=> string(79) "http://172.17.42.1/lims/cache/2ea60115b78febf307f6444366cba6b8.png?_=1679428804" ["iconreal_url"]=> string(79) "http://172.17.42.1/lims/cache/2ea60115b78febf307f6444366cba6b8.png?_=1679428804" ["url"]=> string(55) "http://172.17.42.1/lims/!equipments/equipment/index.344" ["name"]=> string(41) "高分辨透射电子显微镜 (JEM-2100)" ["name_abbr"]=> string(54) "gao fen bian tou she dian zi xian wei jing (JEM-2100)" ["phone"]=> string(11) "13406408632" ["contact"]=> string(9) "马希骋" ["email"]=> string(0) "" ["location"]=> array(0) { } ["location2"]=> string(40) "济南(中心校区)化学二楼129(129)" ["accept_sample"]=> string(1) "1" ["accept_reserv"]=> string(1) "0" ["reserv_url"]=> string(62) "http://172.17.42.1/lims/!equipments/equipment/index.344.reserv" ["sample_url"]=> string(62) "http://172.17.42.1/lims/!equipments/equipment/index.344.sample" ["price"]=> string(7) "3370000" ["status"]=> string(1) "0" ["ref_no"]=> string(8) "0706758S" ["cat_no"]=> string(8) "03040701" ["model_no"]=> string(7) "JEM2100" ["control_mode"]=> string(0) "" ["is_using"]=> string(1) "0" ["connect"]=> string(1) "0" ["is_monitoring"]=> string(1) "0" ["is_monitoring_mtime"]=> string(1) "0" ["current_user"]=> string(2) "--" ["accept_limit_time"]=> string(1) "0" ["organization"]=> string(0) "" ["specification"]=> string(15) "点分辨0.23nm" ["tech_specs"]=> string(225) "点分辨率：0.23nm;线分辨率：0.14nm;加速 电压 ：200kV 放大倍数 ：50~1.5M CCD 相机分辨率：1024×1024像素 X 射线能谱仪（Oxford X-Max）: 元素分析范围：B5~U92; 最小分析区域：10nm" ["features"]=> string(1151) "基本功能 ： （1）衍射衬度像：可获得衬度清晰的样品形貌和 材料内部的显微结构特征。 （2）高分辨电子显微图像 ： 可获得晶体的一维晶 格条纹像、二维晶格点阵像和原子结构像。 （3）电子衍射花样：可获得晶体不同取向的电子 衍射花样。 （4）X射线能谱：可对试样微小区域的成分作定 性和定量分析。 本仪器主要用于材料内部的显微结构分析和微区 成分分析，主要应用如下 ： （1）物相鉴定：采用电子衍射花样和高分辨晶格 像或原子结构像相结合的方法，对未知物相进行研究判定，并可揭示原子分辨尺度上的显微结构细节，在一定条件下，可获得材料相变过程及显微结构 变化的信息。 （2）材料显微结构表征 ：如材料的形貌、尺寸、缺陷及取向关系等等。 （3）对纳米材料、薄膜材料等的结构研究具有特别的优势。 利用 X射线能谱对材料的微小区域进行定性及定量分析，把材料的结构研究和成分分析结合起来，有益于对材料的全面了解。" ["configs"]=> string(0) "" ["open_reserv"]=> string(0) "" ["charge_info"]=> string(0) "" ["manu_at"]=> string(0) "" ["manufacturer"]=> string(0) "" ["manu_date"]=> string(10) "1128096000" ["purchased_date"]=> string(10) "1193846400" ["control_address"]=> string(0) "" ["require_training"]=> string(1) "1" ["ctime"]=> string(10) "1679428804" ["atime"]=> string(10) "1694534400" ["mtime"]=> string(10) "1679428804" ["access_code"]=> NULL ["group"]=> array(3) { [65]=> string(45) "结构成分与物性测量平台（化学）" [15]=> string(21) "化学与化工学院" [4]=> string(12) "山东大学" } ["group_id"]=> string(2) "65" ["group_name"]=> string(45) "结构成分与物性测量平台（化学）" ["tag_root_id"]=> string(3) "266" ["billing_dept_id"]=> string(1) "0" ["incharges"]=> string(9) "马希骋" ["tags"]=> string(9) "电镜类" ["incharges_info"]=> array(1) { [487]=> string(9) "马希骋" } ["contacts_info"]=> array(1) { [487]=> string(9) "马希骋" } ["tagsInfo"]=> array(1) { [9]=> string(9) "电镜类" } ["en_name"]=> string(0) "" ["yiqikong_share"]=> string(1) "1" ["bluetooth_serial_address"]=> string(0) "" } string(21) "化学与化工学院"